Английская Википедия:Critical area (computing)

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Шаблон:For In integrated circuit design, a critical area is a section of a circuit design wherein a particle of a particular size can cause a failure.[1] It measures the sensitivity of the circuit to a reduction in yield.[2]

The critical area <math display="inline">(A_c)</math> on a single layer integrated circuit design is given by:

<math display="block">A_c =\int_{0}^{\infty} A(r)D(r)dr</math>

where <math>A(r)</math> is the area in which a defect of radius <math>r</math> will cause a failure, and <math>D(r)</math> is the density function of said defect.[3]

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